Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to conductive state
Patent
1997-04-25
1999-11-30
Bowers, Charles
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
Using structure alterable to conductive state
438132, 438467, H01L 2182
Patent
active
059941707
ABSTRACT:
The present invention is a method and apparatus for programming a stack of segments wherein each segment includes a plurality of die which are interconnected through metal interconnects patterned on the surface of each segment. Once the segments are arranged into a stack, the stack is connected to external circuits and each segment is addressed through control lines. Electrically conductive fuses on the segments are used as an interface between the control lines and the die. Segment level programming is performed on each segment by opening the conductive fuses on the segments in a predetermined pattern in order to route the control lines to each segment such that segments are uniquely addressed. After segment level programming, circuit board programming is performed so that any defective die found in the stack is logically replaced with replacement die in the stack. This is accomplished by connecting a set of metal switches between all the die and each of the control lines and by dispensing a conductive epoxy whisker between the control line for the defective die and the metal switch of the replacement die. When a subsequent attempt is made to address the defective die in the stack, the replacement die is accessed instead.
REFERENCES:
patent: Re28481 (1975-07-01), Shields et al.
patent: 3646666 (1972-03-01), Boleky et al.
patent: 3679941 (1972-07-01), Lacombe et al.
patent: 3691628 (1972-09-01), Kim et al.
patent: 3702025 (1972-11-01), Archer
patent: 3769702 (1973-11-01), Scarbrough
patent: 3778886 (1973-12-01), Shields et al.
patent: 3813650 (1974-05-01), Hunter
patent: 3813773 (1974-06-01), Parks
patent: 3983619 (1976-10-01), Kubo et al.
patent: 3999105 (1976-12-01), Archey
patent: 4300153 (1981-11-01), Hayakawa
patent: 4387503 (1983-06-01), Aswell et al.
patent: 4426773 (1984-01-01), Hargis
patent: 4525921 (1985-07-01), Carson et al.
patent: 4598462 (1986-07-01), Chandrasekhar
patent: 4612083 (1986-09-01), Yasumoto et al.
patent: 4613891 (1986-09-01), Ng et al.
patent: 4646128 (1987-02-01), Carson et al.
patent: 4659931 (1987-04-01), Schmitz
patent: 4672737 (1987-06-01), Carson et al.
patent: 4677528 (1987-06-01), Miniet
patent: 4703170 (1987-10-01), Schmitz
patent: 4706166 (1987-11-01), Go
patent: 4761681 (1988-08-01), Reid
patent: 4764846 (1988-08-01), Go
patent: 4783695 (1988-11-01), Eichelberger
patent: 4801992 (1989-01-01), Golubic
patent: 4803595 (1989-02-01), Kraus
patent: 4807021 (1989-02-01), Okumura
patent: 4827327 (1989-05-01), Miyauchi et al.
patent: 4862249 (1989-08-01), Carlson
patent: 4894706 (1990-01-01), Sato et al.
patent: 4897708 (1990-01-01), Clements
patent: 4901136 (1990-02-01), Neugebauer et al.
patent: 4907128 (1990-03-01), Solomon
patent: 4939568 (1990-07-01), Kato
patent: 4941033 (1990-07-01), Kishida
patent: 4954875 (1990-09-01), Clements
patent: 4956694 (1990-09-01), Eide
patent: 4956695 (1990-09-01), Robinson
patent: 4956746 (1990-09-01), Gates et al.
patent: 4959749 (1990-09-01), Dzarnoski
patent: 4983533 (1991-01-01), Go
patent: 4989063 (1991-01-01), Kolesar, Jr.
patent: 4996583 (1991-02-01), Hatada
patent: 5006923 (1991-04-01), Warren
patent: 5013687 (1991-05-01), Solomon
patent: 5019943 (1991-05-01), Fassbender
patent: 5025306 (1991-06-01), Johnson et al.
patent: 5028986 (1991-07-01), Sugano et al.
patent: 5032896 (1991-07-01), Little et al.
patent: 5055425 (1991-10-01), Leibovitz
patent: 5075253 (1991-12-01), Sliwa, Jr.
patent: 5093708 (1992-03-01), Solomon
patent: 5104820 (1992-04-01), Go et al.
patent: 5111278 (1992-05-01), Eichelberger
patent: 5117282 (1992-05-01), Salatino
patent: 5128831 (1992-07-01), Fox, II et al.
patent: 5135556 (1992-08-01), Hornback
patent: 5138437 (1992-08-01), Kunamoto et al.
patent: 5138438 (1992-08-01), Masayuki
patent: 5172303 (1992-12-01), Bernardoni
patent: 5191404 (1993-03-01), Wu
patent: 5191405 (1993-03-01), Tomita
patent: 5198888 (1993-03-01), Sugano
patent: 5200300 (1993-04-01), Leibovitz
patent: 5202754 (1993-04-01), Bertin
patent: 5221642 (1993-06-01), Burns
patent: 5222014 (1993-06-01), Lin
patent: 5229647 (1993-07-01), Gnadinger
patent: 5231304 (1993-07-01), Solomon
patent: 5247423 (1993-09-01), Kin et al.
patent: 5259110 (1993-11-01), Bross et al.
patent: 5270261 (1993-12-01), Bertin
patent: 5270571 (1993-12-01), Parks et al.
patent: 5279029 (1994-01-01), Burns
patent: 5279984 (1994-01-01), Kinoshita et al.
patent: 5283107 (1994-02-01), Bayer et al.
patent: 5311401 (1994-05-01), Gates, Jr. et al.
patent: 5330359 (1994-07-01), Walker
patent: 5377077 (1994-12-01), Burns
patent: 5420751 (1995-05-01), Burns
patent: 5446620 (1995-08-01), Burns et al.
patent: 5455740 (1995-10-01), Burns
patent: 5475920 (1995-12-01), Burns et al.
patent: 5479318 (1995-12-01), Burns
patent: 5493476 (1996-02-01), Burns
patent: 5499160 (1996-03-01), Burns
patent: 5502333 (1996-03-01), Bertin et al.
patent: 5532614 (1996-07-01), Chiu
patent: 5543664 (1996-08-01), Burns
patent: 5550711 (1996-08-01), Burns et al.
patent: 5552963 (1996-09-01), Burns
patent: 5561591 (1996-10-01), Burns
patent: 5566051 (1996-10-01), Burns
patent: 5827759 (1998-10-01), Froehner
patent: 5844296 (1998-12-01), Murray et al.
patent: 5853603 (1998-12-01), Caillat
Wojnarowski, R.J., et al. "Three Dimensional Hybrid Wafer Scale Integration Using the GE High Density Interconnect Process," IEEE International Conference on Wafe Scale Integration, Jan. 20, 1993.
Conte, Al S. "MCM-L The Answer for Desktop Workstations," ICEMM Proceedings, (1993), pp. 18-21.
Finley Michael G.
Pedersen David V.
Sautter Kenneth M.
Bowers Charles
Cubic Memory Inc.
Sulsky Martin
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