Silicon device with uniformly thick polysilicon

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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357 23, 357 4, 427 85, 427 86, 427 93, 427 9, H01L 2904

Patent

active

042284520

ABSTRACT:
Thickness control problems inherent in the chemical vapor deposition of polysilicon layers on silicon wafers are avoided by an improved vacuum deposition technique.

REFERENCES:
patent: 4109273 (1978-08-01), Glasl et al.
patent: 4151006 (1979-04-01), De Graaf et al.
Brodsky et al., I.B.M. Tech. Discl. Bull, vol. 19, No. 3, Aug. 1976, p. 1119.

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