Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Havin growth from molten state
Patent
1998-06-05
2000-08-01
Utech, Benjamin L.
Single-crystal, oriented-crystal, and epitaxy growth processes;
Processes of growth from liquid or supercritical state
Havin growth from molten state
117 78, 117 79, 117931, C30B 910, C30B 2906
Patent
active
060961287
ABSTRACT:
A germanium layer 19 is melted on top of a starting polycrystalline silicon ingot 18, at a temperature below the melting point of pure silicon. Silicon is dissolved at the interface and floats to the top of the germanium melt to form a silicon melt layer 11, from which a crystal 20 can be drawn. The process permits the production of large diameter crystal with low oxygen content and no more than one percent germanium.
REFERENCES:
patent: 4357201 (1982-11-01), Grabmaier et al.
patent: 4415545 (1983-11-01), Monkowski et al.
Abe Keisei
Maeda Susumu
Nakanishi Hideo
Terashima Kazutaka
Champagne Donald L.
Japan Science and Technology Corporation
Komatsu Electronic Metals Co. Ltd.
Mitsubishi Materials Silicon Corporation
Toshiba Ceramics Co. Ltd.
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