Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-13
2005-12-13
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06976233
ABSTRACT:
A computer-implemented method is disclosed for verifying signal via impedance. Properties of a signal via and of any other vias within a given distance of the signal via are read from a circuit design database. A target characteristic impedance value for the signal via is obtained. A characteristic impedance of the signal via is calculated based on the other vias. The signal via is flagged as having an incorrect characteristic impedance if the calculated characteristic impedance does not match the target characteristic impedance value.
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EDN Magazine, TDA Systems Application Note: Signal Integrity Modeling of Gigabit Backplanes, Cables and Connecotrs Using TDR, pp. 1-8, Jun. 2002.
Bois Karl J.
Frank Mark D.
Nelson Jerimy C.
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