Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-01-18
2005-01-18
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C361S762000, C174S266000, C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06845492
ABSTRACT:
A computer-implemented method for adjusting signal via impedance includes identifying a signal via in a circuit design database. The signal via is flagged as having an impedance error. A window is established around the signal via, with the window lying on a single layer. Only vias in the window may be adjusted to minimize the impedance error. At least one via in the window is adjusted to minimize said impedance error.
REFERENCES:
patent: 4328530 (1982-05-01), Bajorek et al.
patent: 6388208 (2002-05-01), Kiani et al.
Bois Karl J.
Frank Mark D.
Nelson Jerimy C.
Do Thuan
Hewlett--Packard Development Company, L.P.
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