Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Bus or line termination
Reexamination Certificate
2009-05-21
2010-11-30
Tran, Anh Q (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
Bus or line termination
C326S032000, C326S033000
Reexamination Certificate
active
07843213
ABSTRACT:
A memory device is coupled to a subset of lines of a data input/output (I/O) bus. The memory device includes an on-die active termination circuit for terminating the subset of lines of the data I/O bus with a selected impedance being one of a plurality of selectable impedances; a termination value register being coupled to the on-die active termination circuit for storing a value representing the selected impedance; and a termination value setting circuit being coupled to the termination value register, for setting the value representing the selected impedance in the termination value register.
REFERENCES:
patent: 6356106 (2002-03-01), Greeff et al.
patent: 2003/0126338 (2003-07-01), Dodd et al.
patent: 2010/0030934 (2010-02-01), Bruennert et al.
Johnson Jeffrey Eldon
Linder Peter
Wallace James Sanford
Hsu Winston
Margo Scott
Nanya Technology Corp.
Tran Anh Q
LandOfFree
Signal termination scheme for high speed memory modules does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Signal termination scheme for high speed memory modules, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Signal termination scheme for high speed memory modules will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4247131