Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2005-11-22
2005-11-22
Baumeister, B. William (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S068000, C257S071000, C257S238000, C257S905000, C257S906000, C257S908000, C438S017000, C438S239000, C438S244000, C438S250000, C438S253000, C716S030000
Reexamination Certificate
active
06967348
ABSTRACT:
A signal sharing circuit includes a first pad adapted to receive a signal and a first sharing device associated with a first microelectronic die. The first sharing device is adapted to selectively share the signal with at least a second microelectronic die on one side of the first microelectronic die in response to a first share control signal.
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Cowles Timothy B.
Lunde Aron T.
Anya Igwe U.
Baumeister B. William
Micro)n Technology, Inc.
Schwegman Lundberg Woessner & Kluth P.A.
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