Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1996-01-04
1997-09-30
Bennett, G. Bradley
Geometrical instruments
Gauge
Movable contact probe, per se
33559, G01B 503
Patent
active
056715420
ABSTRACT:
An interface circuit for processing signals from a touch trigger probe is adapted to prevent the generation of false trigger signals during an inspection cycle. The probe incorporates a plurality of strain gauges, the voltage across which rises above a predetermined threshold when a stylus supported by the probe contacts a surface. When the probe is moved away from the surface and the stylus loses contact, the outputs across the gauges drop below the trigger threshold. The interface prevents false triggers When, while the stylus is in contact with a surface, a machine vibration occurs which causes an oscillation in the voltage across the gauges; the voltage dropping below the threshold level (causing the interface to reset), and then immediately passing back up through the threshold, causing the interface to emit a trigger signal. The interface of the present invention prevents such an occurrence by returning to its seated level only if, at a predetermined time interval after the sensor signal has passed below the predetermined threshold, the signal level from the or each sensor has not once again exceeded the predetermined threshold value.
REFERENCES:
patent: 4117568 (1978-10-01), Werner et al.
patent: 4153998 (1979-05-01), McMurtry
patent: 4270275 (1981-06-01), McMurtry
patent: 4364180 (1982-12-01), Willhelm et al.
patent: 4455755 (1984-06-01), Fritsche et al.
patent: 4702013 (1987-10-01), McMurtry
patent: 4769919 (1988-09-01), Lloyd et al.
patent: 4817362 (1989-04-01), Archer
patent: 4916339 (1990-04-01), Lloyd
patent: 5024003 (1991-06-01), Breyer
patent: 5111592 (1992-05-01), Aehnelt et al.
patent: 5272817 (1993-12-01), Gonzalez
patent: 5279042 (1994-01-01), Gonzalez et al.
patent: 5435072 (1995-07-01), Lloyd et al.
Patent Abstract of Japan, vol. 11, No. 11 (E-470), JP61185067, Aug. 18, 1986.
Information Disclosure Statement Appendix, pp. 1-4.
Harding Andrew James
Pilborough David Ian
Whittle David R.
Zannis James
Bennett G. Bradley
Renishaw plc
LandOfFree
Signal processing circuit for trigger probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Signal processing circuit for trigger probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Signal processing circuit for trigger probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2248975