4. Geometrical instruments
  5. Gauge
  6. Movable contact probe, per se

Andrew James Harding

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Machine tool workpiece inspection system

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Signal processing circuit for trigger probe

Geometrical instruments – Gauge – Movable contact probe – per se
Patent

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Profile ID: LFUS-PAI-P-1919192

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