Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate
2008-10-21
2011-11-08
Lin, Sun (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Testing or evaluating
C716S108000, C716S113000, C716S115000, C716S134000
Reexamination Certificate
active
08056044
ABSTRACT:
An iterative method for generating a series of output signal values from a series of input signal values is described. Iterations of the method comprise the steps of obtaining a current input signal value for the current iteration, comparing the current input signal value with an output signal value determined in a previous iteration, updating a counter value determined in the previous iteration based on the result of the comparison between the current input signal value and the previous output signal value such that the updated counter value replaces the counter value determined in the previous iteration, determining a slew value based on the counter value; and adding the slew value to the previously determined output signal value to generate a new current output signal value. Thus different slew values may be added to the previous output signal to obtain a new output signal. The counter value is updated so that its value reflects recent trends in the input signals. E.g. if the input signal is on an upward trend, the counter value may achieve a relative high value, for example because it is incremented each time an input signal exceeds a previously determined output signal. The magnitude of the slew values may increase as the counter value increases, thereby allowing the output signals to more rapidly track changes in the input signals.
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Philipp Harald
Yilmaz Esat
Atmel Corporation
Baker & Botts L.L.P.
Lin Sun
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