Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2005-06-21
2005-06-21
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C714S726000, C714S731000, C324S073100, C324S765010
Reexamination Certificate
active
06909274
ABSTRACT:
A test apparatus and a method for testing an integrated circuit's data storage device's input/output signal pins for alternating current (AC) defects, by providing an interface that will couple each respective individual test contact, in a subset of said contacts, to a select plurality of the data storage input/output signal pins so that when a selected data string is introduced into the integrated circuit so that each input/output pin on a data storage device in the integrated circuit will be tested in sequence whereby the number of contacts required by the tester can be reduced.
REFERENCES:
patent: 6058496 (2000-05-01), Gillis et al.
patent: 6242269 (2001-06-01), Whetsel
patent: 6327684 (2001-12-01), Nadeau-Dostie et al.
IBM Technical Disclosure Bulletin, vol. 34, No. 4A, pp. 230-232, Sep. 1991, entitled: Latched I/O Ac Test Using A Reduced Pin Boundary Scan Logic Test Method.
Angelotti Frank W.
Bushard Louis B.
Grady Matthew S.
Strissel Scott A.
International Business Machines - Corporation
Kobert Russell M.
Nguyen Vinh
Thornton Francis J.
Walsh Robert A.
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