Etching a substrate: processes – Etching of semiconductor material to produce an article...
Patent
1996-01-03
1999-02-09
Dang, Thi
Etching a substrate: processes
Etching of semiconductor material to produce an article...
216 12, 216 41, 216 56, 216 87, 216 99, 216109, B05D 500
Patent
active
058689478
ABSTRACT:
A processed Si product suitable for use as, for example, an X-ray mask, is produced by a process having the steps of preparing a non-porous Si substrate, changing by anodization at least a portion of the substrate into porous Si thereby forming at least one porous Si region penetrating the substrate from one to the other side thereof, and effecting an etching on the substrate by using an etchant containing hydrofluoric acid so as to remove the porous Si region. The substrate may be provided with an etching stop layer. In such a case, an unsupported membrane region formed by the etching stop layer is left after the removal of the porous Si region.
REFERENCES:
patent: 3756877 (1973-09-01), Muraoka et al.
patent: 3962052 (1976-06-01), Abbas et al.
patent: 4096619 (1978-06-01), Cook, Jr.
patent: 4171242 (1979-10-01), Liu
patent: 4198263 (1980-04-01), Matsuda
patent: 4966663 (1990-10-01), Mauger
patent: 5201987 (1993-04-01), Hawkins et al.
Uiilir, Electrolytic Shaping of Germanium and Silicon, The Bell System Technical Journal, vol. 35 (1956), pp. 333-347.
Unagami, Form. Mech. of Porous Si Layer by Anodiz. in HF Sol., Jour. of the Electrochemical Soc., vol. 127, No. 2 (1980), pp. 476-483.
Bomchil, et al., Pore Size Distr. in Porous Si Studied by Adsorp. Iso., Jour. of the Electrochemical Soc., vol. 130, No. 7 (1983), pp. 1611-1614.
Holmstrom, et al., Applied Physics Letters, vol. 42, No. 4 (Feb. 15, 1983), pp. 386-388.
Canham, Applied Physics Letters, vol. 57, No. 10 (Sep. 3, 1990) pp. 1046-1048.
Benjamin, et al., Applied Physics Letters, vol. 49, No. 12 (Sep. 22, 1986) pp. 716-718.
Schwuttke, et al., IBM Technical Disclosure Bulletin, vol. 14, No. 11 (Apr. 1972), p. 3405.
Sakaguchi Kiyofumi
Yonehara Takao
Canon Kabushiki Kaisha
Dang Thi
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