Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-12-03
2011-12-27
Warren, Matthew E (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S327000, C257S328000, C257S329000, C257S331000, C257S332000, C257S335000, C257SE29257, C257SE29259, C257SE29260, C257SE29262, C438S212000, C438S268000, C438S270000
Reexamination Certificate
active
08084813
ABSTRACT:
A short gate high power metal oxide semiconductor field effect transistor formed in a trench includes a short gate having gate length defined by spacers within the trench. The transistor further includes a buried region that extends beneath the trench and beyond a corner of the trench, that effectively shields the gate from high drain voltage, to prevent short channel effects and resultantly improve device performance and reliability.
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Harris Christopher
Konstantinov Andrei
Svederg Jan-Olov
Cree Inc.
Lin John
Warren Matthew E
Withrow & Terranova, P.L.L.C.
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