Short channel trenched DMOS transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257335, 257408, H01L 2910

Patent

active

053410114

ABSTRACT:
A DMOS transistor having a trenched gate is formed in a substrate such that the P body region of the transistor may be formed heavier or deeper while still maintaining a "short" channel. This is accomplished by forming a portion of the N+ type source region within the P body region prior to forming the trench, followed by a second implantation and diffusion of a relatively shallow extension of the N+ source region formed overlying a part of the P body region. The increased depth or doping concentration of the P body region advantageously lowers the resistance of the P body region, while the short channel lowers the on-resistance of the transistor for improved performance.

REFERENCES:
patent: 4954854 (1990-09-01), Dhong et al.
patent: 5168331 (1992-12-01), Yilmaz
Barbuscia, et al., pp. 757, IEDM, 1984 "Modeling of Polysilicon Dopant Diffusion for Shallow-Junction Bipolar Technology".
S. C. Sun et al., pp. 356-367, IEEE Trans, Electron Devices, vol. Ed-27, Feb. 1980 "Modeling of the On-Resistance of LDMOS, VDMOS, and VMOS Power Transistors".

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Short channel trenched DMOS transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Short channel trenched DMOS transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Short channel trenched DMOS transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-504650

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.