Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-08-15
2006-08-15
Ho, Hoai V. (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S063000, C365S230030, C365S230050
Reexamination Certificate
active
07092279
ABSTRACT:
A memory array employing shared bit-lines. A memory is formed from an array of plural bit-cells organized as plural columns and plural rows. Plural word-lines are aligned with each for the rows, and each is electrically coupled to a discrete fraction of the bit-cells its corresponding row. The memory also includes plural bit-lines that are aligned with the plural columns. Every bit-line is electrically coupled to all of the bit-cells that lie along at least one column. In addition, at least a first one of the bit-lines is further electrically coupled to all of the bit-cells in an additional column. That bit-line is coupled such that every one of the plural bit-cells, that lie along any given row that are coupled to it, is coupled to a unique word-line from the other bit-cells coupled thereto. The shared bit-line invention is applicable to single and multiple port memory arrays. It is applicable to all memory array technologies including, but not limited to, SRAMs and DRAMs.
REFERENCES:
patent: 5276650 (1994-01-01), Kubota
patent: 6243285 (2001-06-01), Kurth et al.
patent: 6707708 (2004-03-01), Alvandpour et al.
patent: 6711051 (2004-03-01), Poplevine et al.
patent: 6711067 (2004-03-01), Kablanian
patent: 6741492 (2004-05-01), Nii
patent: 6781867 (2004-08-01), Kurth et al.
Brown Daniel R.
Dain Brown Law Office
Ho Hoai V.
LandOfFree
Shared bit line memory device and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Shared bit line memory device and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Shared bit line memory device and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3649816