Serial switch driver architecture for automatic test equipment

Details Serial switch driver architecture for automatic test equipment Serial switch driver architecture for automatic test equipment

1999-02-19

2000-10-24

Tokar, Michael

Electronic digital logic circuitry

Tri-state

326 56, 326 57, 326 59, 326 60, 326 33, 326127, H03K 1900

Patent

active

061373109

ABSTRACT:
A tristate circuit for driving three signal levels to a pin of a device-under-test is disclosed. The tristate circuit includes a driver having an output at a first signal level and adapted for coupling to the pin. A first switching unit couples to the output and responds to a programmed signal. The first switching unit operates to selectively alter the first signal level to a second signal level. A second switching unit connects serially to the first switch. The second switching unit responds to a second programmed signal and operates to cooperate with the first switch to alter the second signal level to a third signal level.

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