Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-02-01
2011-02-01
Doan, Nghia M (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C326S093000, C326S094000, C326S095000, C326S096000, C327S001000, C327S002000, C327S003000, C327S040000, C327S041000, C703S013000, C703S014000, C703S015000, C703S016000, C703S019000
Reexamination Certificate
active
07882473
ABSTRACT:
Mechanisms for performing sequential equivalence checking for asynchronous verification are provided. A first model of the integrated circuit design is provided that has additional logic in it to reflect the possible variance in behavior of the asynchronous crossings. A second model of the integrated circuit design is provided that does not have this asynchronous behavior logic but instead correlates to the simplest synchronous model that is usually used for non-asynchronous functional verification tasks. Sequential equivalence checking is performed to verify that the two models are input/output equivalent. In order to address non-uniform arrival times of bus strands, logic is provided for identifying bus strands that have transitioning bits, determining a representative delay for these strands, comparing the representative delays for all of the bus strands to determine the maximum delay for the entire bus, and applying this maximum delay to one of the models.
REFERENCES:
patent: 4011465 (1977-03-01), Alvarez, Jr.
patent: 5287289 (1994-02-01), Kageyama et al.
patent: 5396435 (1995-03-01), Ginetti
patent: 5426651 (1995-06-01), Van De Burgt
patent: 5452239 (1995-09-01), Dai et al.
patent: 5477474 (1995-12-01), Southgate et al.
patent: 5499192 (1996-03-01), Knapp et al.
patent: 5504690 (1996-04-01), Kageyama et al.
patent: 5526517 (1996-06-01), Jones et al.
patent: 5586047 (1996-12-01), Imahashi
patent: 5649165 (1997-07-01), Jain et al.
patent: 5659484 (1997-08-01), Bennett et al.
patent: 5678040 (1997-10-01), Vasudevan et al.
patent: 5790830 (1998-08-01), Segal
patent: 5828860 (1998-10-01), Miyaoku et al.
patent: 5926622 (1999-07-01), Hardin et al.
patent: 5956257 (1999-09-01), Ginetti et al.
patent: 5958077 (1999-09-01), Banerjee et al.
patent: 5966523 (1999-10-01), Uchino
patent: 5995425 (1999-11-01), Henkels et al.
patent: 6023568 (2000-02-01), Segal
patent: 6026222 (2000-02-01), Gupta et al.
patent: 6049662 (2000-04-01), Saha et al.
patent: 6052524 (2000-04-01), Pauna
patent: 6056784 (2000-05-01), Stanion
patent: 6058252 (2000-05-01), Noll et al.
patent: 6071003 (2000-06-01), Ashuri et al.
patent: 6074426 (2000-06-01), Baumgartner et al.
patent: 6077304 (2000-06-01), Kasuya
patent: 6086626 (2000-07-01), Jain et al.
patent: 6182258 (2001-01-01), Hollander
patent: 6195776 (2001-02-01), Ruiz et al.
patent: 6205559 (2001-03-01), Sakaguchi
patent: 6216219 (2001-04-01), Cai et al.
patent: 6240543 (2001-05-01), Bhandari
patent: 6247165 (2001-06-01), Wohl et al.
patent: 6301687 (2001-10-01), Jain et al.
patent: 6308299 (2001-10-01), Burch et al.
patent: 6321184 (2001-11-01), Baumgartner et al.
patent: 6374393 (2002-04-01), Hirairi
patent: 6446243 (2002-09-01), Huang et al.
patent: 6470481 (2002-10-01), Brouhard et al.
patent: 6516449 (2003-02-01), Masud
patent: 6553514 (2003-04-01), Baumgartner et al.
patent: 6560758 (2003-05-01), Jain
patent: 6587993 (2003-07-01), Shoyama
patent: 6643829 (2003-11-01), Borkovic et al.
patent: 6643832 (2003-11-01), Ray et al.
patent: 6687882 (2004-02-01), McElvain et al.
patent: 6698003 (2004-02-01), Baumgartner et al.
patent: 6714902 (2004-03-01), Chao et al.
patent: 6816825 (2004-11-01), Ashar et al.
patent: 6868535 (2005-03-01), Podkolzin et al.
patent: 6959271 (2005-10-01), Ballam
patent: 6973632 (2005-12-01), Brahme et al.
patent: 7020589 (2006-03-01), Datta Ray et al.
patent: 7086016 (2006-08-01), Matsuzaki et al.
patent: 7194715 (2007-03-01), Charlebois et al.
patent: 7240311 (2007-07-01), Lai et al.
patent: 7257524 (2007-08-01), Schilp et al.
patent: 7260799 (2007-08-01), Baumgartner et al.
patent: 7301362 (2007-11-01), Jang et al.
patent: 7302659 (2007-11-01), Ja et al.
patent: 7340698 (2008-03-01), Srinivasan et al.
patent: 7447620 (2008-11-01), Hidvegi et al.
patent: 7490305 (2009-02-01), Gass et al.
patent: 2001/0020289 (2001-09-01), Pavisic et al.
patent: 2002/0188910 (2002-12-01), Zizzo
patent: 2003/0023941 (2003-01-01), Wang et al.
patent: 2003/0061470 (2003-03-01), Yeh
patent: 2004/0103387 (2004-05-01), Teig et al.
patent: 2004/0225977 (2004-11-01), Akkerman
patent: 2004/0233742 (2004-11-01), Morzano
patent: 2004/0250226 (2004-12-01), Lin et al.
patent: 2005/0246673 (2005-11-01), Charlebois et al.
patent: 2005/0273748 (2005-12-01), Hetzel et al.
patent: 2006/0095879 (2006-05-01), Brahme et al.
patent: 2006/0122817 (2006-06-01), Baumgartner et al.
patent: 2006/0190860 (2006-08-01), Ng et al.
patent: 2006/0190873 (2006-08-01), Baumgartner et al.
patent: 2006/0190883 (2006-08-01), Ja et al.
patent: 2006/0239392 (2006-10-01), Cummings et al.
patent: 2007/0033551 (2007-02-01), Greaves et al.
patent: 2007/0198238 (2007-08-01), Hidvegi et al.
patent: 2007/0271542 (2007-11-01), Ja et al.
patent: 2008/0295052 (2008-11-01), Hidvegi et al.
U.S. Appl. No. 11/457,865, filed Jul. 17, 2006, Gass et al.
Xie et al., “Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion”, IEEE 1992 International Conference on Computer Design: VLSI in Computers and Processors, Oct. 11-14, 1992, pp. 482-485.
Miyamoto et al., “An Efficient Algorithm for Deriving Logic Functions of Asynchronous Circuits”, Proceedings of Second International Symposium on Advanced Research in Asynchronous Circuits and Systems, Mar. 18-21, 1996, pp. 30-35.
Gharaybeh et al., “False-Path Removal Using Delay Fault Simulation”, Proceedings of Seventh Asian Test Symposium, Dec. 2-4, 1998, pp. 82-87.
Bjesse et al., “SAT-Based Verification without State Space Traversal”, FMCAD 2000, LNCS 1954, Springer-Verlag Berlin Heidelberg 2000, Nov. 1-3, 2000, pp. 372-389.
C.A.J. Van Eijk, “Sequential Equivalence Checking without State Space Traversal”, Proceedings of Design, Automation and Test in Europe, Feb. 23-26, 1998, IEEE Computer Society, Los Alamitos, California, pp. 618-623.
USPTO U.S. Appl. No. 11/054,903, Image File Wrapper printed Aug. 26, 2010, 2 pages.
USPTO U.S. Appl. No. 11/054,904, Image File Wrapper printed Aug. 26, 2010, 2 pages.
USPTO U.S. Appl. No. 11/360906, Image File Wrapper printed Aug. 26, 2010, 2 pages.
USPTO U.S. Appl. No. 12/168,888, Image File Wrapper printed Aug. 26, 2010, 1 page.
Burch, Jerry R. et al., “Symbolic Model Checking for Sequential Circuit Verification”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 13, Apr. 1994, pp. 401-424.
East, RE, “Modelling Technique for Master/Slave LSSD Latches with Gated Clocks”, IBM Technical Disclosure Bulletin, vol. 36, No. 09A, Sep. 1993, pp. 155-157.
Forlenza, Do, “Latch Model Reduction Using Latch Behaviorals”, IBM Technical Disclosure Bulletin, vol. 31, No. 09, Feb. 1989, pp. 471-473.
Gerst, Harald, “A general Method to double the Cycle Simulation Speed”, Proceedings of the Tenth Annual IEEE International ASIC Conference and Exhibit, Sep. 1997, pp. 356-359.
Kahle, Ja, “Single-Latch Element Modeling Technique”, IBM Technical Disclosure Bulletin, vol. 36, No. 08, Aug. 1993, pp. 355-356.
Notice of Allowance mailed Oct. 4, 2010 for U.S. Appl. No. 12/168,888; 15 pages.
Baumgartner Jason R.
Ja Yee
Mony Hari
Paruthi Viresh
Ramanandray Barinjato
Doan Nghia M
Gerhardt Diana R.
International Business Machines - Corporation
Walder, Jr. Stephen J
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