Measuring and testing – Fluid pressure gauge – Diaphragm
Reexamination Certificate
2006-12-26
2006-12-26
McCall, Eric S. (Department: 2855)
Measuring and testing
Fluid pressure gauge
Diaphragm
Reexamination Certificate
active
07152478
ABSTRACT:
The electrical pin lead structure and brazing technique of the present invention provide a brazed lead in a sensor that adheres well to a semiconductor substrate while facilitating lateral flexibility without joint fatigue or breakage. In one example embodiment, the pin lead includes a coil head that is brazed to a silicon layer on a sapphire substrate using a silver-copper-palladium braze material. An advantage to this approach is the ability to both braze the pin lead to the diaphragm and seal the diaphragm to the ceramic backing plate with a high temperature glass in a single process step. Further, the palladium in the braze composition is a factor in reducing surface tension between the metal lead and semiconductor substrate during cooling to avoid stress fractures in the substrate.
REFERENCES:
patent: 3916365 (1975-10-01), Giachino
patent: 3930823 (1976-01-01), Kurtz et al.
patent: 3946615 (1976-03-01), Hluchan
patent: 4016644 (1977-04-01), Kurtz
patent: 4065970 (1978-01-01), Wilner
patent: 4127840 (1978-11-01), House
patent: 4151578 (1979-04-01), Bell
patent: 4161887 (1979-07-01), Stone et al.
patent: 4177496 (1979-12-01), Bell et al.
patent: 4202217 (1980-05-01), Kurtz et al.
patent: 4203327 (1980-05-01), Singh
patent: 4207604 (1980-06-01), Bell
patent: 4227419 (1980-10-01), Park
patent: 4236137 (1980-11-01), Kurtz et al.
patent: 4291293 (1981-09-01), Yamada et al.
patent: 4329732 (1982-05-01), Kavli et al.
patent: 4345476 (1982-08-01), Singh
patent: 4347745 (1982-09-01), Singh
patent: 4373399 (1983-02-01), Beloglazov et al.
patent: 4395915 (1983-08-01), Singh
patent: 4398426 (1983-08-01), Park et al.
patent: 4425799 (1984-01-01), Park
patent: 4426673 (1984-01-01), Bell et al.
patent: 4439752 (1984-03-01), Starr
patent: 4501051 (1985-02-01), Bell et al.
patent: 4535283 (1985-08-01), Rabinovich et al.
patent: 4574640 (1986-03-01), Krechmery
patent: 4586109 (1986-04-01), Peters et al.
patent: 4600912 (1986-07-01), Marks et al.
patent: 4656454 (1987-04-01), Rosenberger
patent: 4665754 (1987-05-01), Glenn et al.
patent: 4725406 (1988-02-01), Compton et al.
patent: 4735917 (1988-04-01), Flatley et al.
patent: 4751554 (1988-06-01), Schnable et al.
patent: 4765188 (1988-08-01), Krechmery et al.
patent: 4773269 (1988-09-01), Knecht et al.
patent: 4774843 (1988-10-01), Ghiselin et al.
patent: 4864463 (1989-09-01), Shkedi et al.
patent: 4876892 (1989-10-01), Arabia et al.
patent: 4903000 (1990-02-01), Yajima et al.
patent: 4987782 (1991-01-01), Shkedi et al.
patent: 4994781 (1991-02-01), Sahagen
patent: 4999735 (1991-03-01), Wilner
patent: 5005421 (1991-04-01), Hegner et al.
patent: 5024097 (1991-06-01), Graeger et al.
patent: 5050034 (1991-09-01), Hegner et al.
patent: 5050035 (1991-09-01), Hegner et al.
patent: 5076147 (1991-12-01), Hegner et al.
patent: 5079953 (1992-01-01), Martin et al.
patent: 5088329 (1992-02-01), Sahagen
patent: 5097712 (1992-03-01), Gerst et al.
patent: 5111698 (1992-05-01), Banholzer et al.
patent: 5155061 (1992-10-01), O'Conner et al.
patent: 5174926 (1992-12-01), Sahagen
patent: 5233875 (1993-08-01), Obermeier et al.
patent: 5303594 (1994-04-01), Kurtz et al.
patent: 5315877 (1994-05-01), Park et al.
patent: 5334344 (1994-08-01), Hegner et al.
patent: 5349492 (1994-09-01), Kimura et al.
patent: 5441591 (1995-08-01), Imthurn et al.
patent: 5731522 (1998-03-01), Sittler
patent: 5750899 (1998-05-01), Hegner et al.
patent: 5772322 (1998-06-01), Burns et al.
patent: 5808205 (1998-09-01), Romo
patent: 5954900 (1999-09-01), Hegner et al.
patent: 5955678 (1999-09-01), Chapman et al.
patent: 6012336 (2000-01-01), Eaton et al.
patent: 6031944 (2000-02-01), Youngner
patent: 6612175 (2003-09-01), Peterson et al.
patent: 0723143 (1996-07-01), None
patent: 0990885 (2000-04-01), None
European Search Report dated Jul. 30, 2003.
Cucci Gerald R.
Diaz Jorge Andrés Diaz
Peterson Thomas
Entegris, Inc.
McCall Eric S.
Patterson Thuente Skaar & Christensen P.A.
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