Sensor system for measuring an electric potential signal of...

Details Sensor system for measuring an electric potential signal of... Sensor system for measuring an electric potential signal of...

2005-07-01

2008-12-16

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S658000

Reexamination Certificate

active

07466148

ABSTRACT:
The invention generally pertains to reducing artifact noise signals present when non-invasive capacitive-type signal measurements are taken of static electric fields produced by an object of interest. According to a first preferred embodiment of the invention, a given static artifact signal is reduced by minimizing the potential difference between a ground point of sensor circuitry and the potential of the object. According to a second preferred embodiment of the invention, the change in signal due to motion of the sensor in the field produced by the object is minimized by reducing the impact of changes in coupling to the signal source.

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Horowitz and Hill, “The Art of Electronics”, second edition, p. 266 1989, no month's available.

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