Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-01-31
2011-10-11
Nguyen, Hoai-An D (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S658000, C073S718000
Reexamination Certificate
active
08035402
ABSTRACT:
A sensor including a carrier, a plurality of conductive bumps, a capacitive sensing element connected to the carrier through the conductive bumps, and a cover is provided. The capacitive sensing element has a membrane, and a channel is formed among the capacitive sensing element, the conductive bumps, and the carrier. The cover is disposed on the carrier for covering the capacitive sensing element. A chamber is formed between the capacitive sensing element and the cover. The chamber and the channel are respectively located at two sides of the membrane.
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“Office Action of Japan Counterpart Application”, issued on May 10, 2011, p. 1-p. 2, in which the listed references were cited.
Chen Jen-Yi
Fang Yu-Jen
Sung Po-Hsun
Yen Kai-Hsiang
Industrial Technology Research Institute
Jianq Chyun IP Office
Nguyen Hoai-An D
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