Static information storage and retrieval – Read/write circuit – Noise suppression
Reexamination Certificate
2008-01-29
2008-01-29
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Noise suppression
C365S172000, C365S189020
Reexamination Certificate
active
07324396
ABSTRACT:
A semiconductor memory device is provided that uses a single wordline to access both storage cells of a so-called twin cell. A memory device comprises a plurality of wordlines and a plurality of bitlines in an array, with a plurality of storage cells at certain intersections of wordlines and bitlines. A plurality of sense amplifiers are provided, each of which is connected to at least a first pair of bitlines to detect a voltage difference on the bitlines caused by the charge from a twin storage cell comprised of first and second storage cells at the intersection of a single wordline with said first pair of bitlines, respectively. As a result, each cell of a twin storage cell can be accessed with a single wordline.
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Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Nguyen Dang
Phung Anh
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