Sense amplifier and method for performing a read operation...

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S209000, C365S213000

Reexamination Certificate

active

06760266

ABSTRACT:

FIELD OF THE INVENTION
This invention relates to Magnetoresistive Random Access Memories (MRAMs), and more particularly to a read operation for a MRAM having toggling memory cells.
BACKGROUND OF THE INVENTION
Non-volatile memory devices, such as FLASH memories, are extremely important components in electronic systems. FLASH is a major non-volatile memory device in use today. Disadvantages of FLASH memory include high voltage requirements and slow program and erase times. Also, FLASH memory has a poor write endurance of 10
4
-10
6
cycles before memory failure. In addition, to maintain reasonable data retention, the scaling of the gate oxide is restricted by the tunneling barrier seen by the electrons. Hence, FLASH memory is limited in the dimensions to which it can be scaled.
To overcome these shortcomings, magnetic memory devices are being evaluated. One such device is magnetoresistive RAM (hereinafter referred to as “MRAM”). To be commercially practical, however, MRAM must have comparable memory density to current memory technologies, be scalable for future generations, operate at low voltages, have low power consumption, and have competitive read/write speeds.
For an MRAM device, the stability of the nonvolatile memory state, the repeatability of the read/write cycles, and the memory element-to-element switching field uniformity are three of the most important aspects of its design characteristics. A memory state in MRAM is not maintained by power, but rather by the direction of the magnetic moment vector. Storing data is accomplished by applying magnetic fields and causing a magnetic material in a MRAM device to be magnetized into either of two possible memory states. Reading data stored in the memory is accomplished by sensing differences in tunnel junction resistance in the MRAM cells between the two states. Typically, the stored state of a memory cell can be determined by comparing the cell state to that of a reference cell. However, a problem occurs when the MRAM cell is a “toggling” cell. That is, a write operation for a toggling cell does not set the bit to a particular value or state, but rather toggles the value between the two states. Accordingly, the cell state must be determined first before the write operation takes place. However, the reference cell state must also be determined before it can be used. Therefore, there is a need for a way to determine the state of a MRAM cell without the use of a reference.


REFERENCES:
patent: 4763026 (1988-08-01), Tsen et al.
patent: 5309393 (1994-05-01), Sakata et al.
patent: 6188615 (2001-02-01), Perner et al.
patent: 6191989 (2001-02-01), Luk et al.
patent: 6205073 (2001-03-01), Naji
patent: 6256247 (2001-07-01), Perner
patent: 6379978 (2002-04-01), Goebel et al.
patent: 6392853 (2002-05-01), Li et al.
patent: 6392924 (2002-05-01), Liu et al.
Ranmuthu et al., “A 512K-Bit Magneto Resistive Memory with Switched Capacitor Self-Referencing Sensing,”IEEE Transactions on Circuits and Systems-11: Analog and Digital Signal Processing,1992, vol. 39, No. 8, pp. 585-587.
Ranmuthu et al., “A Sensing Scheme for Giant Magneto-Resistive Memories,”Magnetics Conference, Digest of International Pages, Intermag '93, 1993.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sense amplifier and method for performing a read operation... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sense amplifier and method for performing a read operation..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sense amplifier and method for performing a read operation... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3204618

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.