Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
Reexamination Certificate
2007-10-31
2009-11-17
Fahmy, Wael (Department: 2814)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Having specified scribe region structure
C257S620000, C257SE21238
Reexamination Certificate
active
07618877
ABSTRACT:
In a semiconductor wafer including a plurality of element forming regions formed on a front surface of a semiconductor substrate, a scribe line groove is formed along a periphery of the each of the element forming regions, and stoppers are located at an intersection of the scribe line groove, so as to block the scribe line groove.
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Fahmy Wael
Kalam Abul
McGinn IP Law Group PLLC
NEC Electronics Corporation
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