Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1993-06-18
2000-10-03
Loke, Steven H.
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257529, H01L 2358, H01L 2900
Patent
active
061276944
ABSTRACT:
Regarding a semiconductor device, a burn-in board can be standardized in each package. An IC (100) includes a VCC terminal (2), a GND terminal (3), input terminals (4a, 4b), and output terminals (5), and it also includes a burn-in board setting terminal (14). Input signals applied to the input terminals (4a, 4b) are transmitted to gates 16a and 16b of switching circuit (15) and processed in a function block (7). Regardless of the signals applied to the input terminals (4a, 4b), simply applying a test signal to the burn-in board setting terminal (14), a specified logic is applied to the function block (7). Only if a pin arrangement of the VCC terminal (2), the GND terminal (3), and the burn-in board setting terminal (14) is standardized and determined, burn-in can be performed indifferent of another pin arrangement of the input terminals (4a, 4b).
Loke Steven H.
Mitsubishi Denki & Kabushiki Kaisha
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