Semiconductor wafer and method for testing ferroelectric...

Details Semiconductor wafer and method for testing ferroelectric... Semiconductor wafer and method for testing ferroelectric...

2006-03-09

2008-03-18

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S200000, C365S145000

Reexamination Certificate

active

07345935

ABSTRACT:
A semiconductor wafer includes a plurality of semiconductor chip regions including ferroelectric memory devices, a test chip region, and a wiring that connects each of the plurality of semiconductor chip regions with the test chip region.

REFERENCES:
patent: 5910911 (1999-06-01), Sekiguchi et al.
patent: 6403475 (2002-06-01), Tanabe et al.
patent: 6426904 (2002-07-01), Barth et al.
patent: 2006/0065917 (2006-03-01), Kajita et al.
patent: 09-082772 (1997-03-01), None

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