Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-07-11
2006-07-11
Tran, Thien F. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S208000, C257S209000, C257S620000, C257S665000
Reexamination Certificate
active
07075107
ABSTRACT:
A semiconductor wafer includes a wafer body, a plurality of analog IC dies spacedly and alignedly formed on the wafer body to define a scribe line as a margin formed between each two dies wherein each of the dies has an internal circuit formed therewithin and at least a terminal pad formed along the scribe line, and a conductive arrangement including at least a conductive element formed on the wafer body to electrically connect the terminal pad with the internal circuit of the die in such a manner that when the die is cut off from the wafer body along the scribe line, the terminal pad is cut off from the die so as to keep the internal circuit in the die.
REFERENCES:
patent: 6492666 (2002-12-01), Terada et al.
Chang Yung-Ching
Chen Wei-Jung
Fang Cheng-Yu
Huang Jaw-Shin
Yu Chien-Peng
Advanced Analog Technology, Inc
Tran Thien F.
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