Semiconductor thin film and method for manufacturing same,...

Active solid-state devices (e.g. – transistors – solid-state diode – Semiconductor is an oxide of a metal or copper sulfide

Reexamination Certificate

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C438S658000, C257SE29289

Reexamination Certificate

active

07906777

ABSTRACT:
The present invention provides a semiconductor thin film which can be manufactured at a relatively low temperature even on a flexible resin substrate. As a semiconductor thin film having a low carrier concentration, a high Hall mobility and a large energy band gap, an amorphous film containing zinc oxide and tin oxide is formed to obtain a carrier density of 10+17cm−3or less, a Hall mobility of 2 cm2/V·sec or higher, and an energy band gap of 2.4 eV or more. Then, the amorphous film is oxidized to form a transparent semiconductor thin film40.

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Toshihiro Moriga et al, “Transparent conducting amorphous Zn-Sn-O films deposited by simultaneous dc sputtering”, J. Vac. SCI. Technology, 2004, vol. 22, No. 4, pp. 1705-1710.
H.Q. Chiang et al, “High mobility transparent thin-film transistors with amorphous zinc tin oxide channel layer,” Applied Physics Letters, Jan. 3, 2005, vol. 86, No. 1, pp. 86,013503-1-86,013503-3.
Li, Guiliang (patent agent). “First Office Action.” (State Intellectual Property Office of People's Republic of China.) Jul. 17, 2009, Application No. 200680042994.7, Applicant: Idemitsu Kosan Co., Ltd. Title of Invention: Semiconductor Thin Film and Method for Manufacturing Same, and Thin Film Transistor.
Moriga, Toshihiro et al. “Transparent Conducting Amorphous Zn-Sn-O Films Deposited by Simultaneous Dc Sputtering.” Journal of Vacuum Science & Technology A vol. 22, No. 4 (2004): 1705-1710.

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