Semiconductor testing equipment

Details Semiconductor testing equipment Semiconductor testing equipment

1998-04-21

2000-12-19

Teska, Kevin J.

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

371 221, G06F 1750, G01R 3128

Patent

active

061638757

ABSTRACT:
Semiconductor testing equipment for the present invention includes a command pattern matching circuit 29, a timer circuit 17, an AND circuit 23 which ANDs acceptable product decision signal for inspecting decision change points for a device while being tested, and an OR circuit 24 for ORing the output signal of the timer 17 and the AND circuit 23. It also includes a pattern sequence control circuit 28 for changing the pattern sequence control operation upon receipt of the output signal of this OR circuit 24. The semiconductor testing equipment 1 monitors the changes in the outputs of the pins for all the devices under test 3, 3, . . . being simultaneously tested, detects acceptable products signals for the devices, when executing a specified mode processing of devices under test 3, 3, . . . , ends decision processing in the shortest time, and when the same decision process is repeated more than twice, invalidates the decision for the known defective devices under test 3, 3, . . . in the first processing, reduces the decision processing time and significantly reduces the testing time.

REFERENCES:
patent: 5475815 (1995-12-01), Byers et al.
patent: 5610925 (1997-03-01), Takahashi
patent: 5668819 (1997-09-01), Fukushima
patent: 5963566 (1999-10-01), Rajsuman et al.

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