Semiconductor test apparatus for measuring power supply current

Details Semiconductor test apparatus for measuring power supply current Semiconductor test apparatus for measuring power supply current

1997-09-29

1999-09-28

Do, Diep

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, 324720, G01R 3126

Patent

active

059594632

ABSTRACT:
A power supply voltage (Vcc) is applied to a dummy capacitor having a capacitance identical to that of a bypass capacitor to generate an excessive current. The excessive current is subtracted from a current flowing through an IC and the bypass capacitor to obtain a power supply current (Icc) of the IC. The time required for measuring power supply current (Icc) of the IC is reduced since it is not necessary to wait for attenuation of the excessive current of the bypass capacitor.

REFERENCES:
patent: 5519335 (1996-05-01), Thomas
patent: 5583820 (1996-12-01), Padoan et al.
patent: 5731700 (1998-03-01), McDonald
patent: 5754041 (1998-05-01), Kaito et al.
patent: 5773990 (1998-06-01), Wilstrup et al.

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