Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2005-10-11
2005-10-11
Jackson, Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S347000, C257S797000
Reexamination Certificate
active
06953948
ABSTRACT:
The present invention provides a semiconductor substrate comprising a semiconductor layer3formed on a supporting substrate1with interposition of an insulating layer2therebetween, wherein a mark is formed in a region other than a surface region of the semiconductor layer; and a process for producing the semiconductor substrate.
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Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Jackson Jerome
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