Active solid-state devices (e.g. – transistors – solid-state diode – Specified wide band gap semiconductor material other than... – Diamond or silicon carbide
Patent
1997-10-16
1999-09-14
Crane, Sara
Active solid-state devices (e.g., transistors, solid-state diode
Specified wide band gap semiconductor material other than...
Diamond or silicon carbide
257622, H01L 310312
Patent
active
059526793
ABSTRACT:
A plurality of grooves are formed in a SiC substrate consisting of an n.sup.- -type epitaxial layer and a p-type epitaxial layer layered on the surface of an n.sup.+ -type monocrystalline SiC semiconductor substrate. These grooves are formed in a grid on the SiC substrate. Heat treatment is then carried out to straighten warp of the SiC substrate caused by the growth of the epitaxial layers.
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Current-Voltage and Capacitance-Voltage Characteristics of Metal/Oxide/6H-Silicon Carbide Structure, JPN. J. Appl. Phys., vol. 34(1995) pp. 5567-5573 Part 1, No. 10, Oct. 1995.
Silicon Carbide and Related Materials Proceedings of the Fifth Conference 1-3 Nov. 1993, Washington, DC. USA, Institute of Physics Conference Series Number 137, Institute of Physics Publishing, Bristol and Philadelphia, pp. 54-58.
Kataoka Mitsuhiro
Kitaoka Eiji
Kitou Yasuo
Suzuki Takamasa
Crane Sara
Denso Corporation
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