Semiconductor substrate and a manufacturing method thereof

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148 15, 156636, 428409, 428446, H01L 21304

Patent

active

042761140

ABSTRACT:
This invention relates to a semiconductor substrate and a method of manufacturing the same. In a semiconductor manufacturing process for a Si single crystal wafer or the like, before the step of mirror polishing, the rear surface of a Si wafer is ground to form a damaged layer having a certain fixed thickness, the Si wafer is subsequently etched by chemical etching if desired, and the rear surface is further formed with an oxide film by thermal oxidation if desired, whereby a semiconductor substrate exhibiting an intense gettering effect is manufactured.

REFERENCES:
patent: 3009841 (1961-11-01), Faust
patent: 3041226 (1962-06-01), Pennington
patent: 3128213 (1964-04-01), Gault
patent: 3266961 (1966-08-01), Emels
patent: 3342652 (1967-09-01), Reisman
patent: 3436286 (1969-04-01), Lange
patent: 3615955 (1971-10-01), Regh
patent: 3888053 (1975-06-01), White
patent: 3923567 (1975-12-01), Lawrence
patent: 4144099 (1979-03-01), Edmonds

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor substrate and a manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor substrate and a manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor substrate and a manufacturing method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2434133

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.