Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-09-27
2005-09-27
Pham, Hoai (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S409000
Reexamination Certificate
active
06949797
ABSTRACT:
A semiconductor structure comprises a substrate and a source region formed in the substrate. Further, a drain region is formed in the substrate. The drain region comprises a first drain portion with a first doping concentration and a second drain portion with a second doping concentration, which is lower than the first doping concentration. Between the source region and the second drain portion a channel region is defined. Further, a field plate is provided, which is disposed across the junction between the first drain portion and the second drain portion to reduce the gradient of the electrical field at the junction.
REFERENCES:
patent: 4172260 (1979-10-01), Okabe et al.
patent: 4288806 (1981-09-01), Ronen
patent: 4614959 (1986-09-01), Nakagawa
patent: 6020611 (2000-02-01), Ma et al.
patent: 6153916 (2000-11-01), Roth et al.
patent: 6172400 (2001-01-01), Ng et al.
Krumbein Ulrich
Taddiken Hans
Infineon - Technologies AG
Maginot Moore & Beck
Pham Hoai
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