Semiconductor structure and fabricating method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S335000, C257S338000, C257S341000, C257S350000, C257S351000, C257S357000, C257S369000, C257S401000

Reexamination Certificate

active

11399827

ABSTRACT:
A semiconductor structure is disclosed, including a substrate having therein a first well of a first conductivity type and a second well of a second conductivity type, a first MOS transistor of the first conductivity type and a second MOS transistor of the second conductivity type. The first MOS transistor is disposed on the second well, including a gate structure on the second well and a strained layer of the first conductivity type in an opening in the second well beside the gate structure. The difference between the lattice parameter of a portion of the strained layer near the bottom of the opening and that of the substrate is less than the difference between the lattice parameter of a portion of the strained layer apart from the bottom of the opening and that of the substrate. The second MOS transistor is disposed on the first well.

REFERENCES:
patent: 5977592 (1999-11-01), Baba
patent: 6914307 (2005-07-01), Iwamatsu et al.
patent: 7226820 (2007-06-01), Zhang et al.
patent: 2003/0122199 (2003-07-01), Koyama et al.
patent: 2005/0266631 (2005-12-01), Kim et al.
patent: 2006/0202278 (2006-09-01), Shima et al.
patent: 2007/0018328 (2007-01-01), Hierlemann et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor structure and fabricating method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor structure and fabricating method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor structure and fabricating method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3867463

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.