Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2006-02-28
2006-02-28
Le, Thong Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S189040
Reexamination Certificate
active
07006401
ABSTRACT:
Refresh of memory cells is performed periodically by a refresh timer, and collision between memory access and memory refresh is avoided. When memory access occurs, an F/F163is set by a one shot pulse from an OS circuit161, a memory access request is inputted to a memory accessing pulse generator circuit171through a NOR gate167, and a latch control signal LC and an enable signal REN are outputted. When a refresh request from the refresh timer is inputted to an AND gate168during the memory access, the output of the NOR gate167is at the “L” level, and the refresh request is blocked by the AND gate168. Thereafter, at the time when the latch control signal LC is turned into the “L” level, F/Fs163, 164and165are reset, the output of the NOR gate167is turned into the “H” level, the refresh request is inputted to a refreshing pulse generator circuit170, and a refresh enable signal RERF is outputted.
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Hirota Takuya
Inaba Hideo
Komatsu Noriaki
Nakagawa Atsushi
Takahashi Hiroyuki
Le Thong Q.
Muirhead and Saturnelli LLC
NEC Electronics Corp.
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