Coating apparatus – With indicating – testing – inspecting – or measuring means
Patent
1998-10-30
2000-05-16
Bueker, Richard
Coating apparatus
With indicating, testing, inspecting, or measuring means
118715, 118728, C23C 1600
Patent
active
060631961
ABSTRACT:
An apparatus and method for aligning various components of a semiconductor processing system is disclosed. A calibration tool positioned on the main body of the processing chamber is used to align the coordinates of the susceptor, wafer lifting pins, susceptor shaft, wafer handling blade and the rotational axis of the susceptor with that of the main body. By aligning the various components to a common coordinate system, it is possible to more precisely control the angular orientation of a wafer being processed with that of the processing gas flow.
REFERENCES:
patent: 4951601 (1990-08-01), Maydan
patent: 5000113 (1991-03-01), Wang
Green Timothy
Li Shih-Hung
Applied Materials Inc.
Bueker Richard
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