Semiconductor package having improved adhesiveness and...

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame – With heat sink means

Reexamination Certificate

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C257S668000, C257S666000, C257S676000, C257S696000, C257S680000, C257S774000, C257S775000, C257S712000, C257S717000, C257S713000, C257S707000, C257S684000, C257S796000, C257S667000, C257S711000, C257S706000

Reexamination Certificate

active

06853059

ABSTRACT:
A semiconductor package having improved adhesiveness between the chip paddle and the package body and having improved ground-bonding of the chip paddle. A plurality of through-holes are formed in the chip paddle for increasing the bonding strength of encapsulation material in the package body. A plurality of tabs are formed in the chip paddle may also be used alone or in conjunction with the through-holes to further increase the bonding strength of the encapsulation material in the package body. The tabs provide additional area for the bonding site to ground wires from the semiconductor chip by increasing the length of the chip paddle.

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