Semiconductor memory testing apparatus

Details Semiconductor memory testing apparatus Semiconductor memory testing apparatus

1995-07-07

1997-03-25

Nguyen, Viet Q.

Static information storage and retrieval

Read/write circuit

Testing

365233, 365194, 365236, G11C 2900

Patent

active

056151578

ABSTRACT:
A memory device comprising memory cells associated with word lines for storing data. A timer is connected to determine the length of time during which a selected word line(s) is activated. The word line activation time length is shorter in a testing mode than in a using mode.

REFERENCES:
patent: 5025422 (1991-06-01), Moriwaki et al.
patent: 5079744 (1992-01-01), Tobita et al.
patent: 5400282 (1995-03-01), Suzuki et al.

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