Semiconductor memory, method of testing semiconductor memory...

Details Semiconductor memory, method of testing semiconductor memory... Semiconductor memory, method of testing semiconductor memory...

2005-09-06

2005-09-06

Dinh, Son T. (Department: 2829)

Static information storage and retrieval

Addressing

Particular decoder or driver circuit

C365S185230, C365S189070

Reexamination Certificate

active

06940781

ABSTRACT:
Testing circuits each including a comparator for comparing data read from semiconductor memories to be tested with expected value data and thereby detecting coincidences
on-coincidences, and a counter for counting the number of non-coincidences detected are provided on a printed board for burn-in or within semiconductor memories to be tested. The semiconductor memories can be tested by the testing circuits respectively.

REFERENCES:
patent: 5790559 (1998-08-01), Sato
patent: 5835428 (1998-11-01), Kobayashi
patent: 6173238 (2001-01-01), Fujisaki
patent: 6-338200 (1994-12-01), None
patent: 10-148658 (1998-06-01), None
patent: 11-96792 (1999-04-01), None
patent: 2000-123599 (2000-04-01), None

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