Static information storage and retrieval – Read/write circuit – Including signal comparison
Reexamination Certificate
2006-01-17
2006-01-17
Ho, Hoai (Department: 2827)
Static information storage and retrieval
Read/write circuit
Including signal comparison
C365S205000, C365S230030
Reexamination Certificate
active
06987698
ABSTRACT:
A memory cell array is partitioned into a plurality of memory regions each of which includes a plurality of sense amplifiers and each of which is established as a unit of data input/output. Dummy regions each are formed between every two memory regions and include dummy bit lines that are set to a predetermined voltage at least during the operation of the memory cell array. Since the dummy bit lines are wired between the bit lines of the two adjacent memory regions, the voltage change in the bit lines in any of the memory regions can be prevented from affecting the bit lines in the other memory regions. As a result, malfunction of semiconductor memories can be prevented.
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Bando Yoshihide
Yagishita Yoshimasa
Arent Fox PLLC.
Fujitsu Limited
Ho Hoai
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