Static information storage and retrieval – Read/write circuit – Testing
Patent
1993-12-30
1995-06-13
Popek, Joseph A.
Static information storage and retrieval
Read/write circuit
Testing
36523001, 365205, 365207, 365222, G11C 700
Patent
active
054249902
ABSTRACT:
There is provided a semiconductor memory with which the duty ratio of column selection lines can be raised as well as that of word lines so that the word lines and the column selection lines of the semiconductor memory may be subjected to a screening test along with the peripheral circuits under a same condition for all these components (in terms of electric field and time) while operating the peripheral circuits. The semiconductor memory comprises a memory circuit including a memory cell array and its peripheral circuits, a first circuit for selecting some of the word lines of the memory cell array, the first means being so adapted to select a greater number of word lines for a voltage stress test mode than for a normal operation mode and a second circuit for selecting some of the column selection lines CSL to thereby select the corresponding columns of the memory cell array, the second means being so adapted to select a greater number of column selection lines for a voltage stress test mode than for a normal operation mode.
REFERENCES:
patent: 4651304 (1987-03-01), Takata
patent: 5270982 (1993-12-01), Watanabe
Kabushiki Kaisha Toshiba
Niranjan F.
Popek Joseph A.
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