Semiconductor memory having bit lines with isolation circuits co

Static information storage and retrieval – Read/write circuit – Bad bit

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365 51, 371 103, G11C 700, G11C 11407

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active

050220063

ABSTRACT:
A semiconductor memory device is described in which wordline redundancy is implemented without impacting the access time. A redundant decoder circuit generates a wordline drive inhibit signal which inhibits the generation of a normal wordline signal. Deselection also deselects the normally accessed reference cells, requiring that the redundant cells provide their own reference signal. This last requirement is accomplished by utilization of twin cells for the redundant memory. Placing the redundant memory cells on the sense node side of the bit line isolators enables the effective doubling of the number of redundant cells available each of a plurality of sub-arrays of normal memory.

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patent: 4849938 (1989-07-01), Furutani et al.
Tolley et al, "72-k RAM Stands Up to Soft and Hard Errors", Electronics, vol. 55, No. 12, 6-16-82, pp. 147-151.
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"Intel Application Description AP-131, pp. 14-16".
"An Analyusis of the i2164A", Mosaid Incorporated, pp. 5, 41-52, Apr. 1982.

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