Semiconductor memory device with reliable fuse circuit

Details Semiconductor memory device with reliable fuse circuit Semiconductor memory device with reliable fuse circuit

2007-06-05

2007-06-05

Hur, J. H. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Having fuse element

C365S230080, C365S051000, C365S200000, C365S195000

Reexamination Certificate

active

11113017

ABSTRACT:
A semiconductor memory device includes a plurality of first fuse latch circuits configured to provide redundancy to first addresses, a plurality of second fuse latch circuits configured to provide redundancy to second addresses, and a nullifying circuit configured to make the plurality of second fuse latch circuits ineffective, wherein first fuse positions corresponding to the plurality of first fuse latch circuits intervene between second fuse positions corresponding to the plurality of second fuse latch circuits.

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