Semiconductor memory device with precharging voltage level uncha

Static information storage and retrieval – Read/write circuit – Bad bit

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365203, 3652257, 307219, G11C 2900

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active

053155513

ABSTRACT:
A semiconductor memory device having a redundant circuit for electrically replacing a defective memory cell column with a spare memory cell column. An electric fuse (25) is connected between a precharging voltage line (V.sub.BL) and bit lines (BL, BL). When a defective memory cell exists, the precharging voltage tries to vary through this fuse. However, this fuse is cut off, so that the precharging voltage is prevented from varying. Accordingly, data stored in the remaining memory cells are read out correctly and without delay.

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Haraszti, "Associative Control For Fault-Tolerant CMOS/SOS RAM-S", Sep. 22-24, 1981, pp. 194-198.
IEEE Journal of Solid-State Circuits, "A 256K Dynamic RAM with Page-Nibble Mode", vol. sc-18, No. 5, Oct. 1983, pp. 470-477.

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