Semiconductor memory device with on-die termination circuit

Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Bus or line termination

Reexamination Certificate

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Details

C326S027000, C326S083000

Reexamination Certificate

active

07154295

ABSTRACT:
An on-die termination circuit, which is coupled to a pad and included in a semiconductor memory device, for reducing an interference caused by a signal reflection phenomenon, includes a pull-up block coupled between an output node and a supply voltage; a pull-down block coupled between the output node and a ground; and a control block for receiving an ODT control signal to simultaneously activate the pull-up block and the pull-down block.

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