Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2008-09-12
2010-12-14
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S189050, C365S230030, C365S230080
Reexamination Certificate
active
07852691
ABSTRACT:
A semiconductor memory device comprises a plurality of submacros mutually connected via global data lines. Each of the submacros includes a first and a second memory block, and a memory block control circuit arranged between the first and second memory blocks. The memory block control circuit includes a DQ buffer block connected to the first memory block via first complementary data lines and connected to the second memory block via second complementary data lines. It also includes a dynamic data shift redundancy circuit block connected to the DQ buffer block via local data lines and operative to relieve the first and second memory blocks.
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Iizuka Mariko
Iwai Takayuki
Kabushiki Kaisha Toshiba
Nguyen Van-Thu
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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