Semiconductor memory device using dynamic data shift...

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S189050, C365S230030, C365S230080

Reexamination Certificate

active

07852691

ABSTRACT:
A semiconductor memory device comprises a plurality of submacros mutually connected via global data lines. Each of the submacros includes a first and a second memory block, and a memory block control circuit arranged between the first and second memory blocks. The memory block control circuit includes a DQ buffer block connected to the first memory block via first complementary data lines and connected to the second memory block via second complementary data lines. It also includes a dynamic data shift redundancy circuit block connected to the DQ buffer block via local data lines and operative to relieve the first and second memory blocks.

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patent: 5574729 (1996-11-01), Kinoshita et al.
patent: 6198649 (2001-03-01), Matsudera et al.
patent: 6804155 (2004-10-01), Fukuda
patent: 6865126 (2005-03-01), Fukuda
patent: 6952372 (2005-10-01), Tsuji
patent: 7301833 (2007-11-01), Komura
patent: 2004-118920 (2004-04-01), None

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