Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-06-13
2006-06-13
Le, Vu A. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S189050
Reexamination Certificate
active
07061815
ABSTRACT:
An improved semiconductor memory device providing row/column redundancy. The device includes a plurality of data latches arranged in a row-column matrix connected to a set of bitlines/global bitlines interfacing to read/write circuitry, at least two redundant row/column connected to a redundant bitline/global bitline, a first device for providing a first faulty row/column address in said matrix, a second device for generating other faulty row/column addresses by incrementing or decrementing predetermined numbers from the address provided by the first means, a comparison circuitry receiving as its inputs the accessed row/column address and the faulty row/column addresses, and a control block connected to the said comparison circuitry that receives a control signal such that it enables/disables the redundant and/or other memory cell row/column depending upon signals received from said comparison circuitry and control signal for normal operation of the memory device.
REFERENCES:
patent: 5659551 (1997-08-01), Huott et al.
patent: 5742556 (1998-04-01), Tavrow et al.
patent: 6314030 (2001-11-01), Keeth
Hogan & Hartson L.L.P.
Le Vu A.
STMicroelectronics Pvt. Ltd.
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