Semiconductor memory device, method of manufacturing the...

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

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C365S104000, C365S163000, C365S175000, C365S201000

Reexamination Certificate

active

07995374

ABSTRACT:
A memory cell comprises a variable resistance film; a first conductive film having one surface contacted with one surface of the variable resistance film; and a second conductive film having one surface contacted with another surface of the variable resistance film. A width of the first conductive film or the second conductive film in a direction orthogonal to a direction that a current flows in the first conductive film or the second conductive film is smaller than a width of the variable resistance film in a direction orthogonal to a direction that a current flows in the variable resistance film. The width of the first conductive film and the second conductive film is smaller than a width of the first line and the second line in a direction orthogonal to a direction that a current flows in the first line and the second line.

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U.S. Appl. No. 12/834,255, filed Jul. 12, 2010, Sato, et al.
U.S. Appl. No. 12/871,289, filed Aug. 30, 2010, Yasutake.

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