Semiconductor memory device including a repair circuit which...

Static information storage and retrieval – Read/write circuit – Having fuse element

Reexamination Certificate

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C365S200000, C365S201000, C365S189070

Reexamination Certificate

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07826295

ABSTRACT:
In a semiconductor memory device, a repair circuit includes mode fuses to select one of plural repair modes corresponding to plural kinds of defects, respectively. The semiconductor memory device can repair a defective memory cell having operational margin defect without using redundancy memory cells.

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patent: 6967888 (2005-11-01), Hiraki et al.
patent: 7152187 (2006-12-01), Tran et al.
patent: 2008/0101141 (2008-05-01), Choo et al.
patent: 2008/0247243 (2008-10-01), Kang et al.
patent: 2009/0196113 (2009-08-01), Jeong
patent: 2002-74961 (2002-03-01), None
patent: 2004-164737 (2004-06-01), None

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