Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate
2006-04-25
2006-04-25
Phan, Trong (Department: 2827)
Static information storage and retrieval
Systems using particular element
Magnetoresistive
C365S211000
Reexamination Certificate
active
07035137
ABSTRACT:
A semiconductor memory device comprises word lines, bit lines, memory cells, a row decoder, a column decoder, and a write circuit. The word lines are formed along a first direction. The bit lines are formed along a second direction. Memory cells include magneto-resistive elements and are arranged at intersections of the word lines and the bit lines. The row decoder selects at least one of the word lines. The column decoder selects at least one of the bit lines. The write circuit supplies first and second write currents to a selected word line and selected bit line respectively and writes data into a selected memory cell arranged at the intersection of the selected word line and the selected bit line. The write circuit changes the current values of the first and second write currents according to a temperature change.
REFERENCES:
patent: 5940319 (1999-08-01), Durlam et al.
patent: 5946228 (1999-08-01), Abraham et al.
patent: 5956267 (1999-09-01), Hurst et al.
patent: 6005800 (1999-12-01), Koch et al.
patent: 6072718 (2000-06-01), Abraham et al.
patent: 6104633 (2000-08-01), Abraham et al.
patent: 6314020 (2001-11-01), Hansen et al.
patent: 6459627 (2002-10-01), Sakamoto et al.
patent: 6476753 (2002-11-01), Hansen et al.
patent: 6577549 (2003-06-01), Tran et al.
patent: 6603678 (2003-08-01), Nickel et al.
patent: 6606262 (2003-08-01), Perner
patent: 6611454 (2003-08-01), Hidaka
patent: 6657889 (2003-12-01), Subramanian et al.
patent: 6687178 (2004-02-01), Qi et al.
patent: 8-306014 (1996-11-01), None
patent: 2003-173672 (2003-06-01), None
patent: 2003-257175 (2003-06-01), None
patent: WO 00/10172 (2000-02-01), None
Manoj Bhattacharyya, et al., “Thermal Variations in Switching Fields for Sub-Micron MRAM Cells” IEEE Transactions on Magentics, vol. 37, No. 4, Jul. 2001, pp. 1970-1972.
Takeshi Honda, et al. “MRAM-Writing Circultry to Compensate for Thermal-Varation of Magnetization-Reversal Current”, 2002 Symposium on VLSI Circuits Digest of Technical Papers, Jun. 2002, pp. 156-157.
U.S. Appl. No. 10/807,454, filed Mar. 24, 2004, Iwata et al.
U.S. Appl. No. 11/052,810, filed Feb. 9, 2005, Iwata.
U.S. Appl. No. 10/465,616, filed Jun. 20, 2003, Iwata et al.
U.S. Appl. No. 10/702,662, filed Nov. 7, 2003, Iwata.
U.S. Appl. No. 10/728,917, filed Dec. 8, 2003, Shimizu et al.
U.S. Appl. No. 10/765,131, filed Jan. 28, 2004, Iwata et al.
Takeshi Honda et al., “MRAM-Writing Circuitry to Compensate for Therml-Variation of Magnetization-Reversal Current”, 2002 Symposium On VLSI Circuits Digest of Technical Papers, IEEE Jun. 2002, pp. 156-157.
R. Scheuberlein, et al., 2000 IEEE International Solid-State Circuits Conference, Sesssion 7, TD: Emerging Memory & Device Technologies, paper TA 7.2, pp. 128-129, “A 10NS Read and Write Non-Volatile Memory Array Using a Magnetic Tunnel Junction and FET Switch in each cell”, Feb. 2000.
K. Inomata, et al., Jpn. J. Appl. Phys., vol. 36, part 2, No. 108, pp. L 1380-L1383, “Spin-Dependent Tunneling Between a Soft Ferromagnetic Layer and Hard Magnetic Nanosize Particles”, Oct. 15, 1997.
M. Sato, et al., Jpn. J. Appl. Phys., vol. 36, part 2, No. 28, pp. L 200-L 201, “Spin-Valve-Like Properties of Ferromagnetic Tunnel Junctions”, Feb. 15, 1997.
M. Sato, et al., IEEE Transactions on Magnetics, vol. 33, No. 5, pp. 3553-3555, “Spin-Valve-Like Properties and Annealing Effect in Ferromagnetic Tunnel Junctions”, Sep. 1997.
Iwata Yoshihisa
Nakajima Kentaro
Sagoi Masayuki
Shimizu Yuui
Kabushiki Kaisha Toshiba
Phan Trong
LandOfFree
Semiconductor memory device having memory cells including... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor memory device having memory cells including..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device having memory cells including... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3616901